Copyright © Betalan Jóni, 2020. All rights reserved.

Permission to use, copy and distribute this software and its documentation for non-commercial scientific purpose with or without fee is hereby granted, provided that the above copyright notice appear in all copies and that both that copyright notice and this permission notice appear in supporting documentation and the following paper is cited in the scientific publications related to the usage of this program:

Jóni, B.; Ódor, É.; Maric, M.; Pantleon, W.; Ungár, T.
Microstructure Characterization in Individual Texture Components by X-ray Line Profile Analysis: Principles of the X-TEX Method and Practical Application to Tensile-Deformed Textured Ti.
Crystals 2020, 10, 691.