As a physicist I do scientific research that helps to make the world better. Every new topic force me to study and explore some new techniques and methods that makes the investigation even more interesting.
In my research I collected couple of methods used in this field to evaluate dislocation configurations and also implemented two new ones. The evaluation on randomized and patternized dislocation configurations showed the difference and effectiveness of the different evaluation techniques.
With a sensitive enough evaluation method one can show that discrete dislocation systems indeed exhibit pattern formation and the characteristic length scales with the average dislocation spacing instead of the simulation space for large enough system sizes.
The mergence of dislocation patterns on a continuum level can be shown with a minimalistic 2D single slip system, the characteristic scale of patterns is well predicted and has been numerically investigated already. How could one incorporate solute atoms into the picture? One can express the coupled partial differential equations for dislocation densities and for the non-pinned solute atom density, including their self and cross interaction. The resulting coupled differential equations are complicated even in their linearized form. The number of parameters is also high, and it makes the investigation not simply difficult but also lengthy.
There are research topics I were involved in before, but I put no more focus on these fields.
In my work published in Disorder is good for you ... a model was proposed for the deformation of a locally disordered but macroscopically homogeneous material which shows softening during plastic deformation. A measure for the internal structural disorder was introduced and its role in strain localisation was investigated with respect to the formation of macroscopic shear bands in such materials. The study has shown strong positive effect of increased heterogeneity and randomness on the deformation properties.
In my work published in Asymmetric X-ray line broadening ... I experimentally investigated the phenomenon of asymmetric X-ray line broadening caused by dislocation polarization. In the experiments I performed, I used single Cu crystals and put external stress on the samples while I was measuring their X-ray diffraction pattern with high angular precision. The dislocation polarization is proportional to the external stress and causes the asymmetricity of the X-ray peaks. Therefore, by measuring the X-ray diffraction one can tell the average polarization of the dislocation systems where the constant factor can be called as an effective susceptibility for dislocation systems.